Compaction of Test Set for Crosstalk Induced Glitch Faults using Pattern Sequencing

Detection of crosstalk induced glitch faults is important as they can result in erroneous output if the glitch effect propagates to a primary output or to an intermediate flipflop. A new method is thus presented in this paper to generate test patterns for crosstalk induced glitch faults followed by compaction of the test set. By considering the spatial and temporal aspects between the victim and neighboring interconnects and further by considering the functional incompatibilities between individual aggressors, test patterns are generated which produce the maximal crosstalk effect on victim net. Compaction of the test set is achieved initially by merging compatible test patterns and subsequently through sequencing of test patterns of the fault list. Experimental results on ISCAS’85 benchmark circuits demonstrate that up to 78% reduction of test patterns can be achieved.